Characterization of InGaSb/GaSb p-n photodetectors in the 1.0- to 2.4-μm wavelength range
Identifieur interne : 00A550 ( Main/Repository ); précédent : 00A549; suivant : 00A551Characterization of InGaSb/GaSb p-n photodetectors in the 1.0- to 2.4-μm wavelength range
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Abstract
Optical and electrical characteristics of InGaSb p-n photodetectors are presented at different temperatures. The device structures were grown on GaSb substrates using organic metal vapor phase epitaxy. Spectral calibration indicates peak responsivity around 2 μm, equivalent to 58% quantum efficiency, with 2.3-μm cutoff at room temperature. Reducing the device temperature increases the responsivity and shifts the cutoff wavelength to a shorter value. Current voltage measurements at different temperatures indicate that tunneling is the primary leakage current mechanism. Assuming Johnson limited performance, detectivity calculations resulted in 4×1010cmHz1/2/W indicating that InGaSb is a superior material for 2-μm detection applications. © 2004 Society of Photo-Optical Instrumentation Engineers.
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<front><div type="abstract" xml:lang="en">Optical and electrical characteristics of InGaSb p-n photodetectors are presented at different temperatures. The device structures were grown on GaSb substrates using organic metal vapor phase epitaxy. Spectral calibration indicates peak responsivity around 2 μm, equivalent to 58% quantum efficiency, with 2.3-μm cutoff at room temperature. Reducing the device temperature increases the responsivity and shifts the cutoff wavelength to a shorter value. Current voltage measurements at different temperatures indicate that tunneling is the primary leakage current mechanism. Assuming Johnson limited performance, detectivity calculations resulted in 4×10<sup>10</sup>
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